Accelerating X-ray Photoelectron
Spectroscopy (XPS) Measurements
Reducing Measurement Time by up to About 90%
Accelerating R&D Using XPS
Accelerating X-ray Photoelectron
Spectroscopy (XPS) Measurements
Reducing Measurement Time by up to About 90%
Accelerating R&D Using XPS
Improving spectral resolution
by correcting shifts in measurement data
Accurate determination of peak position
without fitting
Shortening the
measurement time by reducing the number of measurement points
Spectrum super-resolution technology can increase the measurement point interval (data resolution) of spectrum and waveform data such as spectroscopic analysis and electrical signals. This enables detailed observation of the spectral shape and precise determination of peak positions, enabling high-precision and high-efficiency spectroscopic analysis and electrical signal measurement.