
Beyond current
spectroscopic analysis
Beyond current
spectroscopic analysis
With spectral super-resolution technology, it is possible to increase the measurement point spacing (data resolution) of spectral and waveform data such as spectroscopic analysis and electrical signals. As a result, detailed observation of the spectral shape and precise determination of the peak position can be performed, and high accuracy and high efficiency of spectroscopic analysis and electrical signal measurement can be realized.
We will realize the fundamental technology that supports the manufacturing industry by improving the accuracy and efficiency of inspections of semiconductor materials and chemical products, and by advancing research and development of advanced materials.